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Analog circuit simulation using range arithmetics

Published: 21 January 2008 Publication History

Abstract

The impact of parameter variations in integrated analog circuits is usually analyzed by Monte Carlo methods with a high number of simulation runs. Few approaches based on interval arithmetic were not successful due to tremendous overapproximations. In this paper, we describe an innovative approach computing transient and DC simulations of nonlinear analog circuits with symbolic range representations that keeps correlation information, and hence has a very limited overapproximation. The methods are based on affine and quadratic arithmetic. Ranges are represented by unique symbols so that linear correlation information is preserved. We demonstrate feasibility of the methods by simulation results using complex analog circuits.

References

[1]
M. Andrade, J. Comba, and J. Stolfi. Affine Arithmetic (Extended Abstract). In INTERVAL '94, St. Petersburg, Russia, 1994.
[2]
D. A. Divekar. FET Modeling for Circuit Simulation. Kluwer Academic Publishers, 1988.
[3]
K. S. Eshbaugh. Generation of correlated parameters for statistical circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems, 11(10):1198--1206, 1992.
[4]
N. Femia and G. Spagnuolo. True Worst-Case Circuit Tolerance Analysis Using Genetic Algorithms and Affine Arithmetic. IEEE Transactions on Circuits and Systems, 47(9), 2000.
[5]
D. Grabowski, C. Grimm, and E. Barke. Semi-Symbolic Modeling and Simulation of Circuits and Systems. In International Symposium on Circuits and Systems (ISCAS 2006), Kos, Greece, 2006. IEEE Press.
[6]
C. Grimm, W. Heupke, and K. Waldschmidt. Refinement of Mixed-Signal Systems with Affine Arithmetic. In Design and Test in Europe 2004 (DATE '04), Paris, France, 2004.
[7]
E. R. Hansen. Bounding the solution of interval linear equations. SIAM J. Numer. Anal., 29(5):1493--1503, 1992.
[8]
D. E. Hocevar, P. Yang, T. N. Trick, and B. D. Epler. Transient Sensitivity Computation for MOSFET Circuits. In IEEE Transactions on CAD, Vol. 4, Issue 4, pages 609--620. IEEE press, Oct 1985.
[9]
L. Kolev. Worst-Case Tolerance Analysis of Linear DC and AC Electric Circuits. IEEE Transactions on Circuits and Systems, 49(12), 2002.
[10]
F. Messine. Extensions of affine arithmetic: Application to unconstrained global optimization. In Journal of Universal Computer Science, Vol. 8, Issue 11, pages 992--1015, 2002.
[11]
R. E. Moore. Interval Analysis. Prentice-Hall, Englewood Cliffs, NJ, 1966.
[12]
A. Neumaier. Interval Methods for Systems of Equations. Cambridge University Press, 1990.
[13]
R. Y. Rubinstein. Simulation and the Monte Carlo Method. John Wiley & Sons, Inc., New York, NY, USA, 1981.
[14]
M. W. Tian and C.-J. Shi. Worst Case Tolerance Analysis of Linear Analog Circuits Using Sensitivity Bands. IEEE Transactions on Circuits and Systems, 47(8), 2000.

Cited By

View all
  • (2015)Split and merge strategies for solving uncertain equations using affine arithmeticProceedings of the 8th International Conference on Simulation Tools and Techniques10.4108/eai.24-8-2015.2260594(1-8)Online publication date: 24-Aug-2015
  • (2014)Semi-symbolic analysis of mixed-signal systems including discontinuitiesProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616626(1-4)Online publication date: 24-Mar-2014
  • (2014)Simulation Based Verification with Range Based Signal Representations for Mixed-Signal SystemsProceedings of the 27th Symposium on Integrated Circuits and Systems Design10.1145/2660540.2661010(1-7)Online publication date: 1-Sep-2014
  • Show More Cited By

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Published In

cover image ACM Conferences
ASP-DAC '08: Proceedings of the 2008 Asia and South Pacific Design Automation Conference
January 2008
812 pages
ISBN:9781424419227

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IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 21 January 2008

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ASP-DAC '08 Paper Acceptance Rate 122 of 350 submissions, 35%;
Overall Acceptance Rate 466 of 1,454 submissions, 32%

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Cited By

View all
  • (2015)Split and merge strategies for solving uncertain equations using affine arithmeticProceedings of the 8th International Conference on Simulation Tools and Techniques10.4108/eai.24-8-2015.2260594(1-8)Online publication date: 24-Aug-2015
  • (2014)Semi-symbolic analysis of mixed-signal systems including discontinuitiesProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616626(1-4)Online publication date: 24-Mar-2014
  • (2014)Simulation Based Verification with Range Based Signal Representations for Mixed-Signal SystemsProceedings of the 27th Symposium on Integrated Circuits and Systems Design10.1145/2660540.2661010(1-7)Online publication date: 1-Sep-2014
  • (2009)Formal approaches to analog circuit verificationProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874798(724-729)Online publication date: 20-Apr-2009

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