Exhaustive testing for event driven sequence input interaction is costly and not always practicable for all types of software testing. So, an alternative technique is crucial where optimum/near optimum test case generation is key concern. This paper presents a feasible test suite generation technique using a meta heuristic search called Simulated Annealing (SA) for T-way Event Driven Input Sequence Test Case (EDISTC) Generator and abbreviated as T-way EDISTC-SA generator. The T-way EDISTC-SA technique focuses on a heuristic analysis for generating feasible and near optimum test suite(s), where a cost function carefully initiates acceptable test input sequences and a fine-tuned cooling rate with temperature takes part as an iterative perspective. We corroborate on EDISTC-SA algorithm by doing a number of experiments to achieve optimum and/or near optimum test cases from a number of test input sequences. The experimental results are tested on a real application called Embedded Network Traffic Monitoring System (ENTM). Analysis on EDISTC-SA strategy shows that the optimum test suite is found from some of the iterated solution and there is possibility to have more feasible accepted test suites.