Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions
<p>A conceptual illustration of the vanilla LAN.</p> "> Figure 2
<p>A conceptual illustration of the triplet loss.</p> "> Figure 3
<p>The architecture of the proposed method.</p> "> Figure 4
<p>Demonstration of the 1D convolution operation.</p> "> Figure 5
<p>A flowchart of the proposed method.</p> "> Figure 6
<p>The experimental test rig of CWRU.</p> "> Figure 7
<p>Confusion matrices for experiment 1 results on C1: (<b>a</b>) A<sub>1</sub>: five labels; (<b>b</b>) B<sub>1</sub>: two labels; (<b>c</b>) C<sub>1</sub>: one label.</p> "> Figure 8
<p>Visualization features for experiment 1 results on C1: (<b>a</b>) five labels; (<b>b</b>) two labels; (<b>c</b>) one label.</p> "> Figure 9
<p>Accuracy curves for experiment 1.</p> "> Figure 10
<p>Ablation experimental results for experiment 1.</p> "> Figure 11
<p>Accuracy curves of ablation experiment with 1 labeled sample.</p> "> Figure 12
<p>Heatmaps of experiment 2 results: (<b>a</b>) five label; (<b>b</b>) two label; (<b>c</b>) one label.</p> "> Figure 13
<p>Confusion matrices of experiment 2 results with one label: (<b>a</b>) C1–C4; (<b>b</b>) C4–C1.</p> "> Figure 14
<p>Visualization features of experiment 2 results with one label: (<b>a</b>) C1–C4; (<b>b</b>) C4–C1.</p> "> Figure 15
<p>Three-dimensional histograms of experiment 2 results for comparison: (<b>a</b>) is the comparison with Tri-LAN; (<b>b</b>) is the comparison with Tri-CNN.</p> "> Figure 16
<p>Rotating machinery fault test system.</p> "> Figure 17
<p>Heatmaps of motor experimental results with one label.</p> "> Figure 18
<p>Confusion matrices for cross-working condition task: (<b>a</b>) C3–C4; (<b>b</b>) C4–C3.</p> "> Figure 19
<p>The laboratory test rig of the motorized spindle.</p> "> Figure 20
<p>Heatmaps of experimental results with 1 label.</p> "> Figure 21
<p>Confusion matrices for cross-working condition task: (<b>a</b>) C1–C2; (<b>b</b>) C2–C1.</p> ">
Abstract
:1. Introduction
- These two challenges are usually overcome individually, and few works in the literature have studied these two issues simultaneously.
- Closer attention is paid to expanding labeled data for supervised learning, while considerable fault information contained in unlabeled data is ignored and wasted.
- More than ten labeled training samples are chiefly required; however, the available labeled samples are fewer in real industrial scenarios.
- CLAN, a novel CNN-based ladder network, replaces the vanilla ladder network (LAN) backbone with a CNN and integrates the structure of the vanilla ladder network. Thus, the classification error of labeled samples and the reconstruction error of unlabeled samples can be obtained, and the parameters of the training process can be reduced by a simplified combination activation function and a path-interaction strategy.
- To further alleviate the feature distribution shifting problem under variable working conditions, the triplet loss with the hard sample mining strategy is utilized to enlarge the margin among the embeddings of the limited labeled samples under different working conditions, which enables the proposed method to emphasize the fault-related features.
- The proposed method is evaluated on two datasets: the first is the public bearing dataset from Case Western Reserve University (CWRU) for comparison with other state-of-the-art algorithms and the second is the experimental bearing dataset from our laboratory test rig of the motorized spindle to illustrate its extensive applicability. A few labeled data are selected randomly to verify the effectiveness of the proposed method. Moreover, variable working conditions are able to prove the ability of the learning distribution-invariant features.
2. Primary Theoretical Background of the Proposed Method
2.1. Semi-Supervised LAN
2.2. Triplet Loss
3. The Proposed Method
3.1. An Overview of the Proposed Method
3.2. Reconstruction Loss for Unlabeled Data
3.3. The Classification Error for Labeled Data
3.4. Triplet Loss for Labeled Data
3.5. The Final Objective Function
4. Experimental Studies
4.1. Implementation Details
4.2. Case Study 1: Public Bearing Dataset of CWRU
4.2.1. Fault Dataset Description
4.2.2. Experiments Setup for Fault Diagnosis
4.2.3. Results Analysis for Experiment 1
4.2.4. Results Analysis for Experiment 2
4.3. Case Study 2: Motor Fault Dataset of SZTU
4.3.1. Fault Dataset Description
4.3.2. Results Analysis
4.4. Case Study 3: Laboratory Bearing Dataset of Motorized Spindle Test Rig
4.4.1. Fault Dataset Description and Experiment Setup
4.4.2. Results Analysis
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Module | Network Layer | Kernel Size | Module | Neurons Number | |
---|---|---|---|---|---|
CE-CNN | Conv1d #1 | 16 15 | CE-FC | 896-512-256 | |
Conv1d #2 | 32 15 | DE-FC | 512-896-1024 | ||
Conv1d #3 | 64 5 | Predicting | #1 | Embedding-1024 | |
DE-CNN | TransConv1d #1 | 32 5 | #2 | 1024-64 | |
TransConv1d #2 | 16 15 | #3 | 64-fault classes | ||
TransConv1d #3 | 1 15 | Metric learning |
Methods | CE-CNN | DE-CNN | CE-FC | DE-FC | Predicting | Metric Learning |
---|---|---|---|---|---|---|
Tri-CLAN | ✓ | ✓ | ✓ | ✓ | ||
CLAN | ✓ | ✓ | ✓ | |||
Tri-CNN | ✓ | ✓ | ✓ | |||
CNN | ✓ | ✓ | ||||
Tri-LAN | ✓ | ✓ | ✓ | ✓ | ||
Vanilla LAN | ✓ | ✓ | ✓ |
Parameters | Values |
---|---|
Learning rate | 0.001 |
Training epochs | 100 |
Batch size of labeled data | fault classes |
Batch size of unlabeled data | 200 |
Gaussian noise | (0,1) |
Working Condition | Motor Load (hp) | Motor Speed (rpm) |
---|---|---|
C1 | 0 | 1797 |
C2 | 1 | 1772 |
C3 | 2 | 1750 |
C4 | 3 | 1730 |
Fault Location | Fault Diameter (Inch) | Fault Labels |
---|---|---|
None (Normal) | 0 | 0 |
Inner Raceway (IR) | 0.07 | 1 |
0.14 | 2 | |
0.21 | 3 | |
Outer Raceway (OR) | 0.07 | 4 |
0.14 | 5 | |
0.21 | 6 | |
Ball (B) | 0.07 | 7 |
0.14 | 8 | |
0.21 | 9 |
Name | Training Samples (Labeled/Unlabeled) | Testing Samples |
---|---|---|
A1 | 5/100 | 100 |
B1 | 2/100 | 100 |
C1 | 1/100 | 100 |
Name | Training Samples (Labeled/Unlabeled) | Testing Samples | ||||||
---|---|---|---|---|---|---|---|---|
C1 | C2 | C3 | C4 | C1 | C2 | C3 | C4 | |
A2 | 1/100 | 0 | 0 | 0 | 100 | 100 | 100 | 100 |
2/100 | ||||||||
5/100 | ||||||||
B2 | 0 | 1/100 | 0 | 0 | ||||
2/100 | ||||||||
5/100 | ||||||||
C2 | 0 | 0 | 1/100 | |||||
2/100 | ||||||||
5/100 | ||||||||
D2 | 0 | 0 | 0 | 1/100 | ||||
2/100 | ||||||||
5/100 |
References | Fault Location | Damage Degree | Training Samples (Labeled/Unlabeled) | Accuracy (%) |
---|---|---|---|---|
[42] | ✓ | ✓ | 50/950 | 98.40 |
[43] | ✓ | - | 10/- | 90.93 |
[44] | ✓ | - | 900/- | 88.54 |
[19] | ✓ | ✓ | 300/12,900 | 87.63 |
This work | ✓ | ✓ | 50/1000 | 99.98 |
20/1000 | 99.43 | |||
10/1000 | 92.45 |
Working Condition | Setting Speed (rpm) | Actual Speed (rpm) | Load (N·m) |
---|---|---|---|
C1 | 1750 | 1722 | 33 |
C2 | 1500 | 1490 | 17 |
C3 | 1750 | 1740 | 17 |
C4 | 900 | 875 | 33 |
Fault Location | Fault Labels |
---|---|
Normal | 0 |
Rotor unbalanced motor (RUM) | 1 |
Bending rotor motor (BRM) | 2 |
Faulty bearing motor (FBM) | 3 |
Broken bar motor (BBM) | 4 |
Stator winding fault motor (WFM) | 5 |
Single phase fault motor (SPM) | 6 |
Name | Training Samples (Labeled/Unlabeled) | Testing Samples | ||||||
---|---|---|---|---|---|---|---|---|
C1 | C2 | C3 | C4 | C1 | C2 | C3 | C4 | |
A | 1/100 | 0 | 0 | 0 | 100 | 100 | 100 | 100 |
B | 0 | 1/100 | 0 | 0 | ||||
C | 0 | 0 | 1/100 | 0 | ||||
D | 0 | 0 | 0 | 1/100 |
Name | Training Samples (Labeled/Unlabeled) | Testing Samples | ||
---|---|---|---|---|
C1 | C2 | C1 | C2 | |
A | 1/100 | 0 | 100 | 100 |
B | 0 | 1/100 |
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Yang, Z.; Chen, F.; Xu, B.; Ma, B.; Qu, Z.; Zhou, X. Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. Sensors 2023, 23, 6951. https://doi.org/10.3390/s23156951
Yang Z, Chen F, Xu B, Ma B, Qu Z, Zhou X. Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. Sensors. 2023; 23(15):6951. https://doi.org/10.3390/s23156951
Chicago/Turabian StyleYang, Zheng, Fei Chen, Binbin Xu, Boquan Ma, Zege Qu, and Xin Zhou. 2023. "Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions" Sensors 23, no. 15: 6951. https://doi.org/10.3390/s23156951
APA StyleYang, Z., Chen, F., Xu, B., Ma, B., Qu, Z., & Zhou, X. (2023). Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. Sensors, 23(15), 6951. https://doi.org/10.3390/s23156951