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Detection of defective sensor elements using ΣΔ -modulation and a matched filter

Published: 01 January 2000 Publication History
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References

[1]
D. Hammerschmidt,Sensor Systems - Interface between Environment and Application", Proceedings of the 25th ESSCIRC '99, Duisburg, 1999
[2]
E. Montane et A1,A compact temperature sensor of a 1.0~tm CMOS technology using lateral PNP transistors", Proceedings of the 2nd THERMINIC Workshop, Budapest, 1996
[3]
J. C. Candy, G. C. Temes,Oversampling Delta-Sigma Data Converters", Theory, Design and Simulation", IEEE Press, 1991
[4]
R. J. McEliece,Correlation properties of sets of sequences derived from irreducible cyclic codes", Information and Control 45, 1980

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  1. Detection of defective sensor elements using ΣΔ -modulation and a matched filter

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        cover image ACM Conferences
        DATE '00: Proceedings of the conference on Design, automation and test in Europe
        January 2000
        707 pages
        ISBN:1581132441
        DOI:10.1145/343647
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        • EDAA: European Design Automation Association
        • ECSI
        • EDAC: Electronic Design Automation Consortium
        • SIGDA: ACM Special Interest Group on Design Automation
        • IEEE-CS: Computer Society
        • IFIP: International Federation for Information Processing
        • The Russian Academy of Sciences: The Russian Academy of Sciences

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        Association for Computing Machinery

        New York, NY, United States

        Publication History

        Published: 01 January 2000

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        Sponsor:
        • EDAA
        • EDAC
        • SIGDA
        • IEEE-CS
        • IFIP
        • The Russian Academy of Sciences
        DATE00: Design Automation and Test in Europe
        March 27 - 30, 2000
        Paris, France

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        Overall Acceptance Rate 518 of 1,794 submissions, 29%

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