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Research of Control Chart Pattern Recognition Based on Wavelet Decomposition in Lithium Battery Production

Published: 30 July 2020 Publication History

Abstract

Although the appearance of the control chart can help people visually observe the quality variation in the production process of lithium batteries, the impact of the variation on the battery quality cannot be directly known. How to use the data mining method to find out the relationship between the way of quality parameter variation and the final quality in the production process will have great practical significance for the production of lithium batteries and even the entire industrial production.
This paper uses one-dimensional discrete wavelet decomposition (DWT) combined with radial basis function (RBF) neural networks to identify patterns of process parameters' variation in a lithium battery production line, and then uses clustering method combined with mathematical statistics to find factors affecting battery quality. The research results provide theoretical models and empirical results of pattern recognition analysis for the production process of lithium batteries, and provide theoretical basis and analysis methods for other industrial production processes.

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Shamsuzzaman, Md. (2005). Integrated control chart systems. Doctoral thesis, Nanyang Technological University, Singapore. DOI= https://doi.org/10.32657/10356/47276
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Zhou Haofei. (2012). The Research of Control Chart Pattern Recognition Based on Wavelet Analysis. Zhengzhou University, China.
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    ICBDC '20: Proceedings of the 5th International Conference on Big Data and Computing
    May 2020
    133 pages
    ISBN:9781450375474
    DOI:10.1145/3404687
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    • Shenzhen University: Shenzhen University
    • Sun Yat-Sen University

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 30 July 2020

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    Author Tags

    1. Cluster analysis
    2. Pattern recognition
    3. Quality variation
    4. Wavelet decomposition

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