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Separately Modeling Fault Detection and Removing Testing Effort for Software Reliability Evaluation

Published: 24 May 2019 Publication History

Abstract

Software reliability growth model (SRGM) describes the process of software failure, which is used to evaluate software reliability. Current SRGMs typically assume that software faults are removed once a software fault is detected and no new faults will be brought during this process. In fact, the assumption may be unrealistic. It is possible that new faults may be brought during debugging, which is called imperfect debugging. Thus, in this paper, we propose a new SRGM that incorporates with testing effort and imperfect debugging. We model software fault removal process and detection process separately. Furthermore, testing effort is divided into two efforts, namely detection effort and removal effort. The proposed model is verified by two real data sets and contrasted with other well-known SRGMs. The experimental results show that the proposed model outperforms the comparison models in terms of fitting capability and prediction capability.

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  1. Separately Modeling Fault Detection and Removing Testing Effort for Software Reliability Evaluation

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    CSSE '19: Proceedings of the 2nd International Conference on Computer Science and Software Engineering
    May 2019
    202 pages
    ISBN:9781450371728
    DOI:10.1145/3339363
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

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    • Research Center for Science and Technology for Learning, National Central University, Taiwan

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 24 May 2019

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    Author Tags

    1. Imperfect debugging
    2. Removal process and detection process
    3. SRGM
    4. Testing effort

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    CSSE 2019

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    CSSE '19 Paper Acceptance Rate 33 of 74 submissions, 45%;
    Overall Acceptance Rate 33 of 74 submissions, 45%

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