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A New Aging Sensor for the Detection of Recycled ICs

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Gang QuAuthors Info & Claims

GLSVLSI '20: Proceedings of the 2020 on Great Lakes Symposium on VLSI

Pages 223 - 228

https://doi.org/10.1145/3386263.3407656

Published: 07 September 2020 Publication History

Abstract

The electronics industry has become the main target of counterfeiting. Integrated circuits (ICs) are highly vulnerable to various types of counterfeiting such as recycling. The recycled ICs do not have the performance and service lifetime of the genuine ones, which poses a threat to reliability of electronic systems. In this paper, we propose a novel recycled IC detection method. An authentication mechanism and a parallel circuit unit structures, as an aging sensor, are used to distinguish recycled ICs from fresh ICs. Due to degradation in the field, the path delay of used circuit unit (scan-flip flop for example) will become larger than that in fresh circuit unit, which inspire us to use an authentication procedure to "freeze" the circuit unit-ref, and utilize SR-latch to compare the transmission speed of two circuit channels. Both HSPICE simulation and FPGA silicon implementation results show that this is a cost-effective method with high detection accuracy and secure again standard attacks.

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Cited By

Mahmod JHicks MQuek TGao DZhou JCardenas A(2024)SRAM Imprinting for System Protection and DifferentiationProceedings of the 19th ACM Asia Conference on Computer and Communications Security10.1145/3634737.3657011(453-466)Online publication date: 1-Jul-2024
https://dl.acm.org/doi/10.1145/3634737.3657011
Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Nyako KDevkota SLi FBorra V(2023)Building Trust in Microelectronics: A Comprehensive Review of Current Techniques and Adoption ChallengesElectronics10.3390/electronics1222461812:22(4618)Online publication date: 11-Nov-2023
https://doi.org/10.3390/electronics12224618
Show More Cited By

Index Terms

A New Aging Sensor for the Detection of Recycled ICs
1. Security and privacy
  1. Security in hardware

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Published In

cover image ACM Other conferences

GLSVLSI '20: Proceedings of the 2020 on Great Lakes Symposium on VLSI

September 2020

597 pages

ISBN:9781450379441

DOI:10.1145/3386263

General Chairs:
Tinoosh Mohsenin
University of Maryland, Baltimore County, USA
,
Weisheng Zhao
Beihang University, China
,
Program Chairs:
Yiran Chen
Duke University, USA
,
Onur Mutlu
ETH Zurich, Switzerland

Copyright © 2020 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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New York, NY, United States

Publication History

Published: 07 September 2020

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National Natural Science Foundation of China
Shenzhen Fundamental Science Research Foundation
AFOSR

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GLSVLSI '20

GLSVLSI '20: Great Lakes Symposium on VLSI 2020

September 7 - 9, 2020

Virtual Event, China

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Overall Acceptance Rate 312 of 1,156 submissions, 27%

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Cited By

Mahmod JHicks MQuek TGao DZhou JCardenas A(2024)SRAM Imprinting for System Protection and DifferentiationProceedings of the 19th ACM Asia Conference on Computer and Communications Security10.1145/3634737.3657011(453-466)Online publication date: 1-Jul-2024
https://dl.acm.org/doi/10.1145/3634737.3657011
Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Nyako KDevkota SLi FBorra V(2023)Building Trust in Microelectronics: A Comprehensive Review of Current Techniques and Adoption ChallengesElectronics10.3390/electronics1222461812:22(4618)Online publication date: 11-Nov-2023
https://doi.org/10.3390/electronics12224618
Surabhi VKrishnamurthy PAmrouch HHenkel JKarri RKhorrami F(2023)Golden-Free Robust Age Estimation to Triage Recycled ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.323829142:9(2839-2851)Online publication date: Sep-2023
https://doi.org/10.1109/TCAD.2023.3238291
Aramoon OQu GCui A(2022)Building Hardware Security Primitives Using Scan-based Design-for-Testability2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS54063.2022.9859460(1-6)Online publication date: 7-Aug-2022
https://doi.org/10.1109/MWSCAS54063.2022.9859460
Kalanadhabhatta SDutt RKhursheed SAcharyya A(2021)IC age estimation methodology using IO pad protection diodes for prevention of Recycled ICs2021 IEEE International Symposium on Circuits and Systems (ISCAS)10.1109/ISCAS51556.2021.9401363(1-5)Online publication date: May-2021
https://doi.org/10.1109/ISCAS51556.2021.9401363

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