Fast Estimations of Failure Probability Over Long Time Spans
Authors: 
Michail Noltsis, Panayiotis Englezakis, Eleni Maragkoudaki, Chrysostomos Nicopoulos, Dimitrios Rodopoulos, Francky Catthoor, Yiannakis Sazeides, Davide Zoni, Dimitrios SoudrisAuthors Info & Claims
Pages 1 - 6
Abstract
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transistors on electronic chips. However, it has also brought to surface time-zero and time-dependent variation phenomena that degrade system's performance and threaten functional operation. Hence, the need to capture and describe these mechanisms, as well as effectively model their impact is crucial. To this extent, we follow existing models and propose a complete framework that evaluates failure probability of electronic components. To assess our framework, a case-study of packet-switched Network on Chip (NoC) routers is presented, studying the failure probability of its SRAM buffers.
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Index Terms
- Fast Estimations of Failure Probability Over Long Time Spans
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Published In
July 2018
176 pages
ISBN:9781450358156
DOI:10.1145/3232195
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Published: 17 July 2018
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NANOARCH '18
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NANOARCH '18: IEEE/ACM International Symposium on Nanoscale Architectures
July 17 - 19, 2018
Athens, Greece
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NANOARCH '18 Paper Acceptance Rate 30 of 56 submissions, 54%;
Overall Acceptance Rate 55 of 87 submissions, 63%
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