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abstract

Combining phase identification and statistic modeling for automated parallel benchmark generation

Published: 24 January 2015 Publication History

Abstract

Parallel application benchmarks are indispensable for evaluating/optimizing HPC software and hardware. However, it is very challenging and costly to obtain high-fidelity benchmarks reflecting the scale and complexity of state-of-the-art parallel applications. Hand-extracted synthetic benchmarks are time- and labor-intensive to create. Real applications themselves, while offering most accurate performance evaluation, are expensive to compile, port, recon- figure, and often plainly inaccessible due to security or ownership concerns. This work contributes APPRIME, a novel tool for trace-based automatic parallel benchmark generation. Taking as input standard communication-I/O traces of an application’s execution, it couples accurate automatic phase identification with statistical regeneration of event parameters to create compact, portable, and to some degree reconfigurable parallel application benchmarks. Experiments with four NAS Parallel Benchmarks (NPB) and three real scientific simulation codes confirm the fidelity of APPRIME benchmarks. They retain the original applications’ performance characteristics, in particular the relative performance across platforms.

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Information & Contributors

Information

Published In

cover image ACM SIGPLAN Notices
ACM SIGPLAN Notices  Volume 50, Issue 8
PPoPP '15
August 2015
290 pages
ISSN:0362-1340
EISSN:1558-1160
DOI:10.1145/2858788
  • Editor:
  • Andy Gill
Issue’s Table of Contents
  • cover image ACM Conferences
    PPoPP 2015: Proceedings of the 20th ACM SIGPLAN Symposium on Principles and Practice of Parallel Programming
    January 2015
    290 pages
    ISBN:9781450332057
    DOI:10.1145/2688500
Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 24 January 2015
Published in SIGPLAN Volume 50, Issue 8

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Author Tags

  1. HPC applications
  2. automatic benchmark generation
  3. phase identification
  4. statistical profiling
  5. trace

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