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Physical design and FinFETs

Published: 30 March 2014 Publication History

Abstract

FinFETs have recently overtaken bulk CMOS transistors as the device of choice for systems-on-chip. This paper provides some background on FinFETs together with their associated manufacturing processes and shows how they influence physical design of standard cells as well as place & route and timing closure for larger blocks.

References

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Liebmann, L. Pietromonaco, D., and Graf, M., Decomposition aware standard cell design flows to enable double-patterning technology, Proc. SPIE 7974, Design for Manufacturability through Design-Process Integration V, 2011
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Kahng, A.B., Park, C.-H., Xu, X., and Yao, H., "Layout decomposition for double patterning lithography," in Proc. Int. Conf. Comput. Aided Design, Nov. 2008, pp. 465--472.
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Yeric, G., Cline, B., Sinha, S., Pietromonaco, D., Chandra, V., Aitken, R. The Past, Present, and Future of Design-Technology Co-Optimization, Proc Custom Integrated Circuits Conf (CICC) 2013.
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Wu, S-Y et al, A 16nm FinFET CMOS Technology for Mobile SoC and Computing Applications, Proc Inter. Electron Devices Meeting (IEDM) 2013.
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Sinha, S., Yeric, G., Chandra, V., Cline, B., Cao, Y, Exploring sub-20nm FinFET design with predictive technology models, Proc Design Automation Conf., 2012, pp. 283--288
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Collins, L., FinFET processes demand delicate tradeoffs for mobile SoCs -- GlobalFoundries process architect, Tech Design Forum, June 2013 http://www.techdesignforums.com/blog/2013/06/05/finfet-processes-optimsation/
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Bohr, M. Silicon technology leadership for the mobility era, Intel Developer's Forum, 2012. http://www.intel.com/content/dam/www/public/us/en/documents/presentation/silicon-technology-leadership-presentation.pdf
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Cited By

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  • (2022)Performance-driven Wire Sizing for Analog Integrated CircuitsACM Transactions on Design Automation of Electronic Systems10.1145/355954228:2(1-23)Online publication date: 24-Dec-2022
  • (2022)NCTUcell: A DDA- and Delay-Aware Cell Library Generator for FinFET Structure With Implicitly Adjustable Grid MapIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.316733941:12(5568-5581)Online publication date: Dec-2022
  • (2020)Optimal Standard Cell Library Composition for 7nm2020 IEEE International Symposium on Circuits and Systems (ISCAS)10.1109/ISCAS45731.2020.9180595(1-5)Online publication date: Oct-2020
  • Show More Cited By

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Published In

cover image ACM Conferences
ISPD '14: Proceedings of the 2014 on International symposium on physical design
March 2014
180 pages
ISBN:9781450325929
DOI:10.1145/2560519
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 30 March 2014

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Author Tags

  1. double patterning
  2. finfet
  3. placement
  4. routing
  5. standard cell

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ISPD'14
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ISPD'14: International Symposium on Physical Design
March 30 - April 2, 2014
California, Petaluma, USA

Acceptance Rates

ISPD '14 Paper Acceptance Rate 14 of 40 submissions, 35%;
Overall Acceptance Rate 62 of 172 submissions, 36%

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ISPD '25
International Symposium on Physical Design
March 16 - 19, 2025
Austin , TX , USA

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Cited By

View all
  • (2022)Performance-driven Wire Sizing for Analog Integrated CircuitsACM Transactions on Design Automation of Electronic Systems10.1145/355954228:2(1-23)Online publication date: 24-Dec-2022
  • (2022)NCTUcell: A DDA- and Delay-Aware Cell Library Generator for FinFET Structure With Implicitly Adjustable Grid MapIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.316733941:12(5568-5581)Online publication date: Dec-2022
  • (2020)Optimal Standard Cell Library Composition for 7nm2020 IEEE International Symposium on Circuits and Systems (ISCAS)10.1109/ISCAS45731.2020.9180595(1-5)Online publication date: Oct-2020
  • (2020)Measuring the Accuracy of Layout Area Estimation Models of Tile-Based FPGAs in FinFET Technology2020 30th International Conference on Field-Programmable Logic and Applications (FPL)10.1109/FPL50879.2020.00043(214-219)Online publication date: Aug-2020
  • (2019)A FinFET-Based Framework for VLSI Design at the 7 nm NodeEnergy Efficient Computing & Electronics10.1201/9781315200705-1(3-49)Online publication date: 31-Jan-2019
  • (2019)Modeling and Evaluating the Gate Length Dependence of BTIIEEE Transactions on Circuits and Systems II: Express Briefs10.1109/TCSII.2018.288585066:9(1527-1531)Online publication date: Sep-2019
  • (2019)Low Power Physical Design and Verification in 16nm FinFET Technology2019 3rd International conference on Electronics, Communication and Aerospace Technology (ICECA)10.1109/ICECA.2019.8822211(936-940)Online publication date: Jun-2019
  • (2019)Design and Aging Challenges in FinFET Circuits and Internet of Things (IoT) ApplicationsCircadian Rhythms for Future Resilient Electronic Systems10.1007/978-3-030-20051-0_6(143-189)Online publication date: 13-Jun-2019
  • (2018)ASAP7: A finFET-Based Framework for Academic VLSI Design at the 7 nm NodeLow Power Semiconductor Devices and Processes for Emerging Applications in Communications, Computing, and Sensing10.1201/9780429503634-1(1-44)Online publication date: 6-Aug-2018
  • (2018)Fast and precise routability analysis with conditional design rulesProceedings of the 20th System Level Interconnect Prediction Workshop10.1145/3225209.3225210(1-8)Online publication date: 23-Jun-2018
  • Show More Cited By

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