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INCREDYBLE-TG: INCREmental DYnamic test generation based on LEarning

Authors:

Irith Pomeranz,

Sudhakar M. ReddyAuthors Info & Claims

DAC '93: Proceedings of the 30th international Design Automation Conference

Pages 80 - 85

https://doi.org/10.1145/157485.164583

Published: 01 July 1993 Publication History

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Cited By

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Pomeranz IReddy S(1998)On methods to match a test pattern generator to a circuit-under-testIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/92.7113146:3(432-444)Online publication date: 1-Sep-1998
https://dl.acm.org/doi/10.1109/92.711314
IEEE Transactions on Computers Staff (1995)INCREDYBLEIEEE Transactions on Computers10.1109/12.39118244:6(792-804)Online publication date: 1-Jun-1995
https://dl.acm.org/doi/10.1109/12.391182
So BKime C(1994)ICAT: incremental combinational ATPGProceedings of IEEE VLSI Test Symposium10.1109/VTEST.1994.292326(106-113)Online publication date: 1994
https://doi.org/10.1109/VTEST.1994.292326
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INCREDYBLE-TG: INCREmental DYnamic test generation based on LEarning
1. Hardware

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Published In

DAC '93: Proceedings of the 30th international Design Automation Conference

July 1993

768 pages

ISBN:0897915771

DOI:10.1145/157485

Chairman:
Alfred E. Dunlop
AT&T Bell Labs., Murray Hill, NJ

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 July 1993

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DAC93: The 30th ACM/IEEE Design Automation Conference

June 14 - 18, 1993

Texas, Dallas, USA

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

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Pomeranz IReddy S(1998)On methods to match a test pattern generator to a circuit-under-testIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/92.7113146:3(432-444)Online publication date: 1-Sep-1998
https://dl.acm.org/doi/10.1109/92.711314
IEEE Transactions on Computers Staff (1995)INCREDYBLEIEEE Transactions on Computers10.1109/12.39118244:6(792-804)Online publication date: 1-Jun-1995
https://dl.acm.org/doi/10.1109/12.391182
So BKime C(1994)ICAT: incremental combinational ATPGProceedings of IEEE VLSI Test Symposium10.1109/VTEST.1994.292326(106-113)Online publication date: 1994
https://doi.org/10.1109/VTEST.1994.292326
Pomeranz IReddy S(1994)Gate-level design diagnosis using a learning-based search strategyProceedings of IEEE 3rd Asian Test Symposium (ATS)10.1109/ATS.1994.367222(255-260)Online publication date: 1994
https://doi.org/10.1109/ATS.1994.367222
Pomeranz IReddy SLightner MJess J(1993)Test generation for path delay faults based on learningProceedings of the 1993 IEEE/ACM international conference on Computer-aided design10.5555/259794.259864(428-435)Online publication date: 7-Nov-1993
https://dl.acm.org/doi/10.5555/259794.259864
Pomeranz IReddy S(1993)A learning-based method to match a test pattern generator to a circuit-under-testProceedings of IEEE International Test Conference - (ITC)10.1109/TEST.1993.470599(998-1007)Online publication date: 1993
https://doi.org/10.1109/TEST.1993.470599

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INCREDYBLE: A New Search Strategy for Design Automation Problems with Applications to Testing

A Static Approach to Prioritizing JUnit Test Cases

Spartan: a spectral and entropy-based partial-scan and test point insertion algorithm