Nothing Special   »   [go: up one dir, main page]
Skip to main content
Springer Nature Link
Log in

Terminal reliability analysis of multistage interconnection networks

  • Original Article
  • Published:
International Journal of System Assurance Engineering and Management Aims and scope Submit manuscript

Abstract

Terminal reliability of multistage interconnection network (MIN) is the probability of at least one fault free path between any source–destination nodes pair. MIN is used to interconnect processors and memory modules in multi-processor system. In this paper, terminal reliability is estimated and validated for existing MINs (i.e., SEN, SEN+, SEN+2, GIN, CGIN, PCGIN, 3D-GIN, 4D-GIN-1, 4D-GIN-2, 4D-GIN-3, and SEGINs). The comparison and performance analysis of MINs based on various indices are also presented.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10
Fig. 11
Fig. 12
Fig. 13
Fig. 14
Fig. 15
Fig. 16
Fig. 17
Fig. 18
Fig. 19
Fig. 20
Fig. 21
Fig. 22
Fig. 23
Fig. 24

Similar content being viewed by others

References

  • Bistouni F, Jahanshahi M (2014) Analyzing the reliability of shuffle-exchange networks using reliability block diagrams. Reliab Eng Syst Saf 132:97–106

    Article  Google Scholar 

  • Blake JT, Trivedi KS (1989) Reliability analysis of interconnection networks using hierarchical composition. IEEE Trans Reliab 38(1):111–120

    Article  Google Scholar 

  • Chaturvedi SK, Misra KB (2002) An efficient multi-variable inversion algorithm for reliability evaluation of complex systems using path sets. Int J Reliab Qual Saf Eng 9(3):237–259

    Article  Google Scholar 

  • Chen CW et al (2000) Fault-tolerant gamma interconnection networks by chaining. IEEE Proc-Comput Digit Technol 147(2):75–81

    Article  Google Scholar 

  • Chen CW et al (2003) 3-Disjoint gamma interconnection networks. Int J Syst Softw 66(2):129–134

    Article  Google Scholar 

  • Garhwal S, Srivastava N (2011) Designing a fault-tolerant fully-chained combining switches multi-stage interconnection network with disjoint paths. J Supercomput 55(3):400–431

    Article  Google Scholar 

  • Goyal NK, Rajkumar S (2017) Multi-source multi-terminal reliability evaluation of interconnection networks. Microsyst Technol 23:255–274

    Article  Google Scholar 

  • Gunawan I (2008) Reliability analysis of shuffle-exchange network systems. Reliab Eng Syst Saf 93(2):271–276

    Article  Google Scholar 

  • Gupta S, Pahuja GL (2018a) Effect of different connection patterns of mux and de-mux on terminal reliability and routing scheme of gamma-minus MIN. Int J Reliab Qual Saf Eng 25(1):1850013

    Article  Google Scholar 

  • Gupta S, Pahuja GL (2018b) Design and reliability evaluation of gamma-minus interconnection network. Int J Reliab Qual Saf Eng 25(5):1950003

    Google Scholar 

  • Khanna G, Mishra R, Chaturvedi SK (2016) 4DGIN-3: a new design layout of 4-disjoint gamma interconnection network. J Parallel Distrib Comput 98:40–47

    Article  Google Scholar 

  • Khanna G et al (2017) Design of fault-tolerant shuffle exchange gamma interconnection network layouts. J Interconnect Netw 17(02):1750005

    Article  Google Scholar 

  • Parker D, Raghavendra C (1984) The gamma network. IEEE Trans Comput 33(4):367–373

    Article  Google Scholar 

  • Prakash A, Yadav DK (2019) Design and reliability analysis of fault-tolerant shuffle exchange gamma logical neighborhood interconnection network. J Supercomput. https://doi.org/10.1007/s11227-019-02929-z

    Article  Google Scholar 

  • Rajkumar S, Goyal NK (2014) Design of 4-disjoint gamma interconnection network layouts and reliability analysis of gamma interconnection networks. J Supercomput 69(1):468–491

    Article  Google Scholar 

  • Rajkumar S, Goyal NK (2016) Review of multistage interconnection networks reliability and fault-tolerance. IETE Techn Rev 33(3):223–230

    Article  Google Scholar 

Download references

Acknowledgements

Authors acknowledge the National Institute of Technology Jamshedpur, India for providing the research opportunity and facilities.

Author information

Authors and Affiliations

  1. Department of Electronics & Communication Engg., National Institute of Technology, Jamshedpur, Jamshedpur, Jharkhand, 831014, India

    Amit Prakash

  2. Department of Computer Applications, National Institute of Technology, Jamshedpur, Jamshedpur, Jharkhand, 831014, India

    Dilip Kumar Yadav

  3. IIIT Bhagalpur, Bhagalpur, Bihar, 813210, India

    Arvind Choubey

Authors
  1. Amit Prakash
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Dilip Kumar Yadav
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Arvind Choubey
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Dilip Kumar Yadav.

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Prakash, A., Yadav, D.K. & Choubey, A. Terminal reliability analysis of multistage interconnection networks. Int J Syst Assur Eng Manag 11, 110–125 (2020). https://doi.org/10.1007/s13198-019-00929-z

Download citation

  • Received:

  • Revised:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s13198-019-00929-z

Keywords

Search

Navigation