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Multistage interconnection networks reliability analysis

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Abstract

Multistage interconnection network (MIN) is an interconnection system consisting of multiple layers of interlinked switching elements arranged in a predefined topology allowing processor and memory modules to communicate with each other. Reliability evaluation for MINs is quite evident, as these measures provide user-oriented performance assessment. Reliability analysis of two important interconnection network layouts (shuffle and gamma) are computed and compared here. Reliability expressions are computed mathematically by the path set-based analytical methods using the MVI algorithm.

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Authors and Affiliations

  1. Reliability Engineering Centre, IIT Kharagpur, Kharagpur, West Bengal, India

    S. Rajkumar & Neeraj Kumar Goyal

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  1. S. Rajkumar
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  2. Neeraj Kumar Goyal
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Correspondence to S. Rajkumar.

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Rajkumar, S., Goyal, N.K. Multistage interconnection networks reliability analysis. J Supercomput 72, 2310–2350 (2016). https://doi.org/10.1007/s11227-016-1734-7

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  • DOI: https://doi.org/10.1007/s11227-016-1734-7

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