Abstract
Digital whole slide imaging (WSI) systems allow scanning complete probes at microscopic resolutions, making image compression inevitable to reduce storage costs. While lossy image compression is readily incorporated in proprietary file formats as well as the open DICOM format for WSI, its impact on deep-learning algorithms is largely unknown.We compare the performance of several deep learning classification architectures on different datasets using a wide range and different combinations of compression ratios during training and inference.We use ImageNet pre-trained models, which is commonly applied in computational pathology. With this work, we present a quantitative assessment on the effects of repeated lossy JPEG compression for ImageNet pre-trained models.We showadverse effects for a classification task, when certain quality factors are combined during training and inference. This work was published on the International Workshop on Medical Optical Imaging and Virtual Microscopy Image Analysis [1].
Chapter PDF
Similar content being viewed by others
References
Fischer M, Neher P, Götz M, Xiao S, Almeida SD, Schüffler P et al. Deep-learning on lossily compressed pathology images: adverse effects for ImageNet pre-trained models. Medical Optical Imaging and Virtual Microscopy Image Analysis. Ed. by Huo Y, Millis BA, Zhou Y, Wang X, Harrison AP, Xu Z. Cham: Springer Nature Switzerland, 2022:73–83.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2023 Der/die Autor(en), exklusiv lizenziert an Springer Fachmedien Wiesbaden GmbH, ein Teil von Springer Nature
About this paper
Cite this paper
Fischer, M. et al. (2023). Abstract: Deep-learning on Lossily Compressed Pathology Images. In: Deserno, T.M., Handels, H., Maier, A., Maier-Hein, K., Palm, C., Tolxdorff, T. (eds) Bildverarbeitung für die Medizin 2023. BVM 2023. Informatik aktuell. Springer Vieweg, Wiesbaden. https://doi.org/10.1007/978-3-658-41657-7_53
Download citation
DOI: https://doi.org/10.1007/978-3-658-41657-7_53
Published:
Publisher Name: Springer Vieweg, Wiesbaden
Print ISBN: 978-3-658-41656-0
Online ISBN: 978-3-658-41657-7
eBook Packages: Computer Science and Engineering (German Language)