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"A generalized model for the lifetime of microelectronic components, ..."

Loren J. Wise et al. (2001)

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DOI: 10.1016/S0026-2714(00)00220-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Loren J. Wise, Ronald D. Schrimpf, Harold G. Parks, Kenneth F. Galloway:
A generalized model for the lifetime of microelectronic components, applied to storage conditions. Microelectron. Reliab. 41(2): 317-322 (2001)

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