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"The impact of device width on the variability of post-irradiation leakage ..."

Nadia Rezzak et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.05.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nadia Rezzak, Pierre Maillard, Ronald D. Schrimpf, Michael L. Alles, Daniel M. Fleetwood, Yanfeng Albert Li:
The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies. Microelectron. Reliab. 52(11): 2521-2526 (2012)

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