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"Physical origin of current collapse in Au-free AlGaN/GaN Schottky Barrier ..."

Jie Hu et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.031

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/mr/HuSLRVYBGD14
Jie Hu, Steve Stoffels, Silvia Lenci, Nicolo Ronchi, Rafael Venegas, Shuzhen You, Benoit Bakeroot, Guido Groeseneken, Stefaan Decoutere:
Physical origin of current collapse in Au-free AlGaN/GaN Schottky Barrier Diodes. Microelectron. Reliab. 54(9-10): 2196-2199 (2014)

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