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"Comparison between trap and self-heating induced mobility degradation in ..."

Aditya Kalavagunta et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.10.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KalavaguntaMRS14
Aditya Kalavagunta, Shubhajit Mukherjee, Robert A. Reed, Ronald D. Schrimpf:
Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs. Microelectron. Reliab. 54(3): 570-574 (2014)

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