default search action

combined dblp search
author search
venue search
publication search

ask others

"Design Flow Methodology for Radiation Hardened by Design CMOS ..."

Pablo Ilha Vaz et al. (2018)

> Home

Details and statistics

DOI: 10.1007/S10836-018-5760-7

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/VazBVBW18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/VazBVBW18
Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson I. Wirth:
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library. J. Electron. Test. 34(6): 735-747 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.