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"Selecting High-Quality Delay Tests for Manufacturing Test and Debug."

Hangkyu Lee et al. (2006)

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DOI: 10.1109/DFT.2006.57

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/LeeNPP06
Hangkyu Lee, Suriyaprakash Natarajan, Srinivas Patil, Irith Pomeranz:
Selecting High-Quality Delay Tests for Manufacturing Test and Debug. DFT 2006: 59-70

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