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"Dedicated MEMS-based test structure for 3D SiP interconnects reliability ..."

Tomasz Bieniek et al. (2013)

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DOI: 10.1109/3DIC.2013.6702375

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  - conf/3dic/BieniekJDSEGJZ13
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  - https://dblp.org/rec/conf/3dic/BieniekJDSEGJZ13
Tomasz Bieniek, Grzegorz Janczyk, Rafal Dobrowolski, Dariusz Szmigiel, Magdalena Ekwinska, Piotr Grabiec, Pawel Janus, Jerzy Zajac:
Dedicated MEMS-based test structure for 3D SiP interconnects reliability investigation. 3DIC 2013: 1-6

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