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Piotr Grabiec
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2010 – 2019
- 2019
- [j7]Henryk Josinski
, Adam Switonski
Assessment of Local Dynamic Stability in Gait Based on Univariate and Multivariate Time Series. Comput. Math. Methods Medicine 2019: 6917658:1-6917658:13 (2019) - 2018
- [c7]Henryk Josinski, Piotr Grabiec, Magdalena Pawlyta
Analysis of Chaotic Behaviors in Gait of the Elderly using the CAREN Extended System. HealthCom 2018: 1-6 - 2016
- [c6]Francesco Ivaldi
New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout. ESSDERC 2016: 444-447 - 2014
- [j6]Grzegorz Janczyk, Tomasz Bieniek, Jerzy Wasowski, Piotr Grabiec:
Investigation on reliability of interconnects in 3D heterogeneous systems by ageing beam resonance method. Microelectron. J. 45(7): 981-987 (2014) - [c5]Tomasz Bieniek, Grzegorz Janczyk, Magdalena Ekwinska, T. Budzynski, Piotr Gluszko, Piotr Grabiec, Andrzej Kociubinski
Novel methodology for 3D MEMS-IC design and co-simulation on MEMS microphone smart system example. 3DIC 2014: 1-5 - [c4]Michal Zaborowski, Daniel Tomaszewski
Fabrication and characterization of junctionless MOSFETs for sensor applications. MIXDES 2014: 367-371 - 2013
- [c3]Tomasz Bieniek, Grzegorz Janczyk, Rafal Dobrowolski, Dariusz Szmigiel, Magdalena Ekwinska, Piotr Grabiec, Pawel Janus, Jerzy Zajac:
Dedicated MEMS-based test structure for 3D SiP interconnects reliability investigation. 3DIC 2013: 1-6 - 2012
- [j5]Artur Rydosz
A gas micropreconcentrator for low level acetone measurements. Microelectron. Reliab. 52(11): 2640-2646 (2012) - [c2]Michal Zaborowski, Daniel Tomaszewski, Piotr Dumania, Piotr Grabiec:
From FinFET to nanowire ISFET. ESSDERC 2012: 165-168 - 2011
- [j4]Michal Zaborowski, Daniel Tomaszewski
Development and characterisation of nanowire-based FETs. Microelectron. Reliab. 51(7): 1162-1165 (2011) - [j3]Stanislaw Kalicinski, Tomasz Bieniek, Pawel Janus, Piotr Grabiec:
Determination of electrical and mechanical parameters in capacitive MEMS accelerometers using electrical measurements. Microelectron. Reliab. 51(7): 1192-1197 (2011)
2000 – 2009
- 2009
- [c1]Grzegorz Janczyk, Tomasz Bieniek, Jerzy Szynka, Piotr Grabiec:
Reliability aspects of 3D-oriented heterogeneous device design related to stress sensitivity of MOS transistors. 3DIC 2009: 1-6 - 2008
- [j2]Grzegorz Janczyk, Tomasz Bieniek, Jerzy Szynka, Piotr Grabiec:
Reliability issues of e-Cubes heterogeneous system integration. Microelectron. Reliab. 48(8-9): 1133-1138 (2008) - 2005
- [j1]Halina Niemiec, Antonio Bulgheroni, Massimo Caccia
Monolithic active pixel sensor realized in SOI technology - concept and verification. Microelectron. Reliab. 45(7-8): 1202-1207 (2005)
Coauthor Index
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