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Grzegorz Mrugalski
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2020 – today
- 2023
- [j27]Grzegorz Mrugalski
, Janusz Rajski
X-Masking for Deterministic In-System Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4260-4269 (2023) - 2022
- [j26]Bartosz Kaczmarek
LBIST for Automotive ICs With Enhanced Test Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2290-2300 (2022) - [c39]Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak:
X-Masking for In-System Deterministic Test. ETS 2022: 1-6 - [c38]Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak:
DIST: Deterministic In-System Test with X-masking. ITC 2022: 20-27 - 2021
- [j25]Wu-Tung Cheng, Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski
Autonomous Scan Patterns for Laser Voltage Imaging. IEEE Trans. Emerg. Top. Comput. 9(2): 680-691 (2021) - [j24]Yingdi Liu
X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan. IEEE Trans. Very Large Scale Integr. Syst. 29(8): 1553-1566 (2021) - 2020
- [j23]Wu-Tung Cheng
Scan Integrity Tests for EDT Compression. IEEE Des. Test 37(4): 21-26 (2020) - [c37]Jakub Janicki, Grzegorz Mrugalski, Artur Stelmach, Szczepan Urban:
Scan Chain Diagnosis-Driven Test Response Compactor. ATS 2020: 1-6 - [c36]Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer:
Test Sequence-Optimized BIST for Automotive Applications. ETS 2020: 1-6 - [c35]Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak:
X-Tolerant Tunable Compactor for In-System Test. ITC 2020: 1-10
2010 – 2019
- 2019
- [c34]Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka
On Cyclic Scan Integrity Tests for EDT-based Compression. VTS 2019: 1-6 - 2017
- [j22]Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer
Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(4): 683-693 (2017) - [j21]Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Trimodal Scan-Based Test Paradigm. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1112-1125 (2017) - 2015
- [j20]Wu-Tung Cheng, Yan Dong, Grady Giles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. IEEE Trans. Very Large Scale Integr. Syst. 23(6): 1050-1062 (2015) - [j19]Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Low-Power Programmable PRPG With Test Compression Capabilities. IEEE Trans. Very Large Scale Integr. Syst. 23(6): 1063-1076 (2015) - [c33]Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang:
TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. ATS 2015: 19-24 - [c32]Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer:
A deterministic BIST scheme based on EDT-compressed test patterns. ITC 2015: 1-8 - 2014
- [j18]Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Erratum to "Test Time Reduction in EDT Bandwidth Management for SoC Designs". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(1): 167 (2014) - [c31]Maciej Trawka
High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. ATS 2014: 74-80 - [c30]Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Test Compression with Programmable Broadcast-Based Control. ATS 2014: 174-179 - [c29]Marcin Gebala, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Using Implied Values in EDT-based Test Compression. DAC 2014: 11:1-11:6 - 2013
- [j17]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Deploying Scan Chains for Data Storage in Test Compression Environment. IEEE Des. Test 30(1): 68-76 (2013) - [j16]Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Test Time Reduction in EDT Bandwidth Management for SoC Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(11): 1776-1786 (2013) - [c28]Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski:
New test compression scheme based on low power BIST. ETS 2013: 1-6 - 2012
- [j15]Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
EDT Bandwidth Management in SoC Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(12): 1894-1907 (2012) - [c27]Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski:
Bandwidth-aware test compression logic for SoC designs. ETS 2012: 1-6 - [c26]Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski:
Low power programmable PRPG with enhanced fault coverage gradient. ITC 2012: 1-9 - [c25]Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Benoit Nadeau-Dostie:
Test generator with preselected toggling for low power built-in self-test. VTS 2012: 1-6 - 2011
- [j14]Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer:
Ring Generator: An Ultimate Linear Feedback Shift Register. Computer 44(6): 64-71 (2011) - [j13]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electron. Test. 27(5): 599-609 (2011) - [j12]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer:
Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(8): 1225-1238 (2011) - [c24]Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer:
Low Power Decompressor and PRPG with Constant Value Broadcast. Asian Test Symposium 2011: 84-89 - [c23]Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek:
Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium 2011: 419-424 - [c22]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. ETS 2011: 1-6 - [c21]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Reduced ATE Interface for High Test Data Compression. ETS 2011: 99-104 - [c20]Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski:
EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. ITC 2011: 1-9 - 2010
- [j11]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Compaction Utilizing Inter and Intra-Correlation of Unknown States. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(1): 117-126 (2010) - [c19]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of failing scan cells through orthogonal response compaction. ETS 2010: 221-226 - [c18]Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer:
Dynamic channel allocation for higher EDT compression in SoC designs. ITC 2010: 265-274 - [c17]Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer:
Low power compression of incompatible test cubes. ITC 2010: 704-713
2000 – 2009
- 2009
- [j10]Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Scan Operation in Test Compression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1742-1755 (2009) - [c16]Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
Compression based on deterministic vector clustering of incompatible test cubes. ITC 2009: 1-10 - [c15]Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
Highly X-Tolerant Selective Compaction of Test Responses. VTS 2009: 245-250 - 2008
- [j9]Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab:
X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(1): 147-159 (2008) - [j8]Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1278-1290 (2008) - [c14]Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Scan Shift and Capture in the EDT Environment. ITC 2008: 1-10 - 2007
- [j7]Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai:
X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Des. Test Comput. 24(5): 476-485 (2007) - [j6]Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer:
Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electron. Test. 23(1): 35-45 (2007) - [j5]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Fault Diagnosis With Convolutional Compactors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(8): 1478-1494 (2007) - [c13]Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
New Test Data Decompressor for Low Power Applications. DAC 2007: 539-544 - [c12]Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Embedded Deterministic Test. VTS 2007: 75-83 - 2006
- [j4]Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
High Performance Dense Ring Generators. IEEE Trans. Computers 55(1): 83-87 (2006) - [c11]Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Test response compactor with programmable selector. DAC 2006: 1089-1094 - [c10]Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab:
X-Press Compactor for 1000x Reduction of Test Data. ITC 2006: 1-10 - 2005
- [c9]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang:
Convolutional compaction-driven diagnosis of scan failures. ETS 2005: 176-181 - [c8]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Diagnosis with convolutional compactors in presence of unknown states. ITC 2005: 10 - 2004
- [j3]Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Ring generators - new devices for embedded test applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1306-1320 (2004) - [c7]Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski:
Fault Diagnosis in Designs with Convolutional Compactors. ITC 2004: 498-507 - [c6]Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Planar High Performance Ring Generators. VTS 2004: 193-198 - 2003
- [j2]Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski:
2D Test Sequence Generators. IEEE Des. Test Comput. 20(1): 51-59 (2003) - [c5]Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
High Speed Ring Generators and Compactors of Test Data. VTS 2003: 57-62 - 2002
- [c4]Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310 - 2000
- [j1]Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Cellular automata-based test pattern generators with phase shifters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(8): 878-893 (2000) - [c3]Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski:
Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. VTS 2000: 377-388
1990 – 1999
- 1999
- [c2]Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski:
Synthesis of pattern generators based on cellular automata with phase shifters. ITC 1999: 368-377 - [c1]Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer:
Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. VTS 1999: 236-245
Coauthor Index
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last updated on 2024-04-24 23:13 CEST by the dblp team
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