default search action

combined dblp search
author search
venue search
publication search

ask others

"Embedded Deterministic Test for Low-Cost Manufacturing Test."

Janusz Rajski et al. (2002)

> Home

Details and statistics

DOI: 10.1109/TEST.2002.1041773

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/RajkiTKMTTHTMEQ02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/RajkiTKMTTHTMEQ02
Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.