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Shianling Wu
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2010 – 2019
- 2012
- [j5]Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Wen-Ben Jone, Michael S. Hsiao, Fangfang Li, James Chien-Mo Li, Jiun-Lang Huang:
Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. ACM Trans. Design Autom. Electr. Syst. 17(4): 48:1-48:16 (2012) - [c19]Kelvin Nelson, Jaga Shanmugavadivelu, Jayanth Mekkoth, Venkat Ghanta, Jun Wu, Fei Zhuang, Hao-Jan Chao, Shianling Wu, Jie Rao, Lizhen Yu, Laung-Terng Wang:
Physical-design-friendly hierarchical logic built-in self-test - A case study. ISQED 2012: 1-6 - 2011
- [j4]Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhigang Jiang, Lang Tan, Yu Zhang, Yu Hu, Wen-Ben Jone, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Lizhen Yu:
Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(3): 455-463 (2011) - 2010
- [j3]Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Hiroshi Furukawa, Hao-Jan Chao, Boryau Sheu, Jianghao Guo, Wen-Ben Jone:
Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(2): 299-312 (2010) - [c18]Lizhen Yu, Jeffrey Hung, Boryau Sheu, Bill Huynh, Loc Nguyen, Shianling Wu, Laung-Terng Wang, Xiaoqing Wen:
Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs. DFT 2010: 331-339 - [c17]Shianling Wu, Laung-Terng Wang, Lizhen Yu, Hiroshi Furukawa, Xiaoqing Wen, Wen-Ben Jone, Nur A. Touba, FeiFei Zhao, Jinsong Liu, Hao-Jan Chao, Fangfang Li, Zhigang Jiang:
Logic BIST Architecture Using Staggered Launch-on-Shift for Testing Designs Containing Asynchronous Clock Domains. DFT 2010: 358-366 - [c16]Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li:
CSER: BISER-based concurrent soft-error resilience. VTS 2010: 153-158
2000 – 2009
- 2009
- [j2]Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Wen-Ben Jone, Jianghao Guo, Kuen-Jong Lee, Wei-Shin Wang, Xiaoqing Wen, Hao-Jan Chao, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li:
Turbo1500: Core-Based Design for Test and Diagnosis. IEEE Des. Test Comput. 26(1): 26-35 (2009) - [c15]Jun Qian, Xingang Wang, Qinfu Yang, Fei Zhuang, Junbo Jia, Xiangfeng Li, Yuan Zuo, Jayanth Mekkoth, Jinsong Liu, Hao-Jan Chao, Shianling Wu, Huafeng Yang, Lizhen Yu, FeiFei Zhao, Laung-Terng Wang:
Logic BIST Architecture for System-Level Test and Diagnosis. Asian Test Symposium 2009: 21-26 - [c14]Hyoung-Kook Kim, Wen-Ben Jone, Laung-Terng Wang, Shianling Wu:
Analysis of Resistive Bridging Defects in a Synchronizer. Asian Test Symposium 2009: 443-449 - 2008
- [j1]Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu:
VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Des. Test Comput. 25(2): 122-130 (2008) - [c13]Shianling Wu, Hiroshi Furukawa, Boryau Sheu, Laung-Terng Wang, Hao-Jan Chao, Lizhen Yu, Xiaoqing Wen, Michio Murakami:
Practical Challenges in Logic BIST Implementation. ATS 2008: 265 - [c12]Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte:
On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151 - [c11]Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li:
Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard. ITC 2008: 1-9 - 2007
- [i1]B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Jin Woo Cho, J. Park, Hao-Jan Chao, Shianling Wu:
At-Speed Logic BIST for IP Cores. CoRR abs/0710.4645 (2007) - 2006
- [c10]Hiroshi Furukawa, Xiaoqing Wen, Laung-Terng Wang, Boryau Sheu, Zhigang Jiang, Shianling Wu:
A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. ITC 2006: 1-10 - 2005
- [c9]B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Jin Woo Cho, J. Park, Hao-Jan Chao, Shianling Wu:
At-Speed Logic BIST for IP Cores. DATE 2005: 860-861 - [c8]Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo:
At-Speed Logic BIST Architecture for Multi-Clock Designs. ICCD 2005: 475-478 - [c7]Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu:
Test compression and logic BIST at your fingertips. ITC 2005: 2 - [c6]Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang:
UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. ITC 2005: 8 - 2004
- [c5]Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai:
VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. ITC 2004: 916-925 - 2000
- [c4]Kwang-Ting Cheng, Vishwani D. Agrawal, Jing-Yang Jou, Li-C. Wang, Chi-Feng Wu, Shianling Wu:
Collaboration between Industry and Academia in Test Research. Asian Test Symposium 2000: 17
1990 – 1999
- 1998
- [c3]Carlos G. Parodi, Vishwani D. Agrawal, Michael L. Bushnell, Shianling Wu:
A non-enumerative path delay fault simulator for sequential circuits. ITC 1998: 934-943 - 1996
- [c2]Najmi T. Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau:
Lessons Learned from Practical Applications of BIST/B-S Technology. Asian Test Symposium 1996: 251-257
1980 – 1989
- 1985
- [c1]Sivanarayana Mallela, Shianling Wu:
A Sequential Circuit Test Generation System. ITC 1985: 57-61
Coauthor Index
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