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Xinfu Liu
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2020 – today
- 2024
- [j9]Runqiu Yang
, Xinfu Liu
Convex Hull Relaxation of Optimal Control Problems With General Nonconvex Control Constraints. IEEE Trans. Autom. Control. 69(6): 4028-4034 (2024) - [j8]Hailiang Kuang
Convergence-Guaranteed Trajectory Optimization for Quadrotors Subject to Aerodynamic Drag. IEEE Trans. Aerosp. Electron. Syst. 60(5): 7251-7261 (2024) - [c2]Xinfu Liu, Yirui Wu, Yuting Zhou, Junyang Chen, Huan Wang, Ye Liu, Shaohua Wan:
Enhancing Large Language Models with Multimodality and Knowledge Graphs for Hallucination-free Open-set Object Recognition. VLDB Workshops 2024 - 2023
- [j7]Peng Lu
Ascent Trajectory Optimization With Nonlinearity-Kept Convexification. IEEE Trans. Aerosp. Electron. Syst. 59(3): 3236-3250 (2023) - 2022
- [j6]Runqiu Yang, Xinfu Liu:
Reachable set computation of linear systems with nonconvex constraints via convex optimization. Autom. 146: 110632 (2022) - [j5]Xinfu Liu
Convergence-Guaranteed Trajectory Planning for a Class of Nonlinear Systems With Nonconvex State Constraints. IEEE Trans. Aerosp. Electron. Syst. 58(3): 2243-2256 (2022) - 2021
- [i1]Chenyang Xi, Bo Tang, Jiajun Shen, Xinfu Liu, Feiyu Xiong, Xueying Li:
Interpretable performance analysis towards offline reinforcement learning: A dataset perspective. CoRR abs/2105.05473 (2021)
2010 – 2019
- 2016
- [j4]Xinfu Liu, Zuo-jun Shen:
Rapid Smooth Entry Trajectory Planning for High Lift/Drag Hypersonic Glide Vehicles. J. Optim. Theory Appl. 168(3): 917-943 (2016) - [j3]Fei Lyu
Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices. Sensors 16(1): 106 (2016) - [j2]Xinfu Liu, Zuo-jun Shen, Ping Lu:
Exact convex relaxation for optimal flight of aerodynamically controlled missiles. IEEE Trans. Aerosp. Electron. Syst. 52(4): 1881-1892 (2016) - 2015
- [j1]Fei Lyu
Performance Comparison of Cross-Like Hall Plates with Different Covering Layers. Sensors 15(1): 672-686 (2015)
2000 – 2009
- 2008
- [c1]Xinfu Liu, Jinhe Liu, Zhanping Du, Quanming Zhao, Junying Zhao, Yuhui Huang:
The Research on Non-destructive Testing Method of Sheet Resistance in Micro Area of Silicon Wafer Based on EIT Technology. IIH-MSP 2008: 1494-1497
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