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"TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement."

Benyuan Zhu et al. (2019)

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DOI: 10.1109/IRPS.2019.8720558

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-14

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  - https://dblp.org/rec/conf/irps/ZhuBTLBHHZCQW19
Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan:
TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement. IRPS 2019: 1-4

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