default search action

combined dblp search
author search
venue search
publication search

ask others

"Fail Pattern Identification for Memory Built-In Self-Repair."

Rei-Fu Huang et al. (2004)

> Home

Details and statistics

DOI: 10.1109/ATS.2004.43

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/HuangSWLLC04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/HuangSWLLC04
Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang:
Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.