default search action
Jacques Pinaton
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2022
- [c46]Dima El Jamal, Bouchra Ananou, Guillaume Graton
, Mustapha Ouladsine, Jacques Pinaton:
LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes. ECC 2022: 491-496 - 2021
- [c45]Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry. CDC 2021: 1356-1362 - [c44]Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. ECC 2021: 1768-1773 - [c43]Dima El Jamal, Bouchra Ananou, Guillaume Graton
Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction. ICCAD 2021: 1-7 - [c42]Dima El Jamal
Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction. ICPHM 2021: 1-7 - 2020
- [j4]Wei-Ting Yang
A physics-informed Run-to-Run control framework for semiconductor manufacturing. Expert Syst. Appl. 155: 113424 (2020) - [j3]Wei-Ting Yang
A Structure Data-Driven Framework for Virtual Metrology Modeling. IEEE Trans Autom. Sci. Eng. 17(3): 1297-1306 (2020)
2010 – 2019
- 2019
- [c41]Taki Eddine Korabi, Guillaume Graton
Monitoring of a sampled process data under Run-to-Run control: application to a semiconductor process. CASE 2019: 930-935 - [c40]Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. CDC 2019: 4741-4746 - [c39]Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing. CoDIT 2019: 1155-1160 - [c38]Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network*. ICSC 2019: 423-428 - [c37]Abdelhak Khemiri, Maâmar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton:
Limiting state space explosion of model checking using discrete event simulation: combining DEVS and PROMELA. SummerSim 2019: 9:1-9:12 - 2018
- [c36]Taki Eddine Korabi, Guillaume Graton
A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing. PRIME 2018: 53-56 - [c35]Abdelhak Khemiri, Maâmar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton:
Improving Business Process in semiconductor manufacturing by Discovering Business Rules. WSC 2018: 3441-3448 - [c34]Karim Tamssaouet
A Study on the Integration of Complex Machines in Complex Job shop Scheduling. WSC 2018: 3561-3572 - [c33]Wei-Ting Yang
Virtual Metrology Modeling based on Gaussian Bayesian Network. WSC 2018: 3574-3582 - [c32]Taki Eddine Korabi, Guillaume Graton
A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk. WSC 2018: 3592-3602 - 2017
- [j2]Tiago J. Rato
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 14(2): 894-904 (2017) - [c31]Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
Analysis of similarities between alarm events in the semiconductor manufacturing process. MED 2017: 888-894 - [c30]Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton:
Product quality prediction using alarm data : Application to the semiconductor manufacturing process. MED 2017: 1332-1338 - [c29]Ali Ben-Salem, Claude Yugma, Emmanuel Troncet, Jacques Pinaton:
A Simulation-Based Approach for an Effective AMHS Design in a Legacy Semiconductor Manufacturing Facility. WSC 2017: 3600-3611 - 2016
- [c28]Julien Marino, Francesco Rossi
Gaussian Time Error: A new index for fault detection in semiconductor processes. ACC 2016: 3237-3242 - [c27]Guillaume Graton
Online optimized parameters for RLS-LT controller - application to processes with mixed products and feature aging. ICSC 2016: 7-12 - [c26]Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton:
Regularized regression models to predict the product quality in multistep manufacturing. ICSC 2016: 31-36 - [c25]Mohamed Ali Jebri, Guillaume Graton
Virtual metrology on Chemical Mechanical Planarization process based on Just-In-Time Learning. ICSC 2016: 169-174 - [c24]El Mostafa El Adel, Guillaume Graton
Run To Run control based on categorical output in semiconductor manufacturing. ICSC 2016: 180-185 - [c23]Guillaume Graton
Self-tuning of dEWMA controller parameters for mixed product processes with equipment aging. MED 2016: 1373-1378 - [c22]Jakey Blue, Agnès Roussy, Jacques Pinaton:
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing. WSC 2016: 2523-2534 - 2015
- [j1]Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès
Optimized allocation of defect inspection capacity with a dynamic sampling strategy. Comput. Oper. Res. 53: 319-327 (2015) - [c21]Thi-Bich-Lien Nguyen, Mohand Djeziri, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton:
Degradation modelling with operating mode changes. ICPHM 2015: 1-5 - [c20]Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton:
Defect diagnosis using in line product control data in semiconductor industry. ICSC 2015: 212-217 - [c19]Alejandro Sendón, Stéphane Dauzère-Pérès
Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing. WSC 2015: 2941-2952 - 2014
- [c18]Sylvain Housseman, Stéphane Dauzère-Pérès
Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing. CASE 2014: 780-785 - [c17]Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton:
A Pattern-based Approach for Semantic Retrieval of Information Resources in Enterprises - Application Within STMicroelectronics. ICEIS (1) 2014: 193-200 - [c16]Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton:
Similar sample selection approach based on sequence alignment; application to semiconductor industry. MED 2014: 287-292 - 2013
- [c15]Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton:
A semantic support to improve the collaborative control of manufacturing processes in industries. CSCWD 2013: 433-438 - [c14]Alexis Thieullen, Mustapha Ouladsine, Jacques Pinaton:
Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment. ECC 2013: 1445-1450 - [c13]Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton:
A Semantic Mapping Approach to Retrieve Manufacturing Information Resources: STMicroelectronics' Case Study. MIM 2013: 2069-2074 - [c12]Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing. WSC 2013: 3684-3695 - 2012
- [c11]Gloria Rodríguez-Verján, Eric Tartiere, Jacques Pinaton, Stéphane Dauzère-Pérès
Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing. CASE 2012: 920-923 - [c10]Sara Bouzid, Corine Cauvet, Jacques Pinaton:
A Topic-Map-based Framework to Enhance Components' Retrieval in a Process Control. ICEIS (2) 2012: 146-149 - [c9]Sara Bouzid, Corine Cauvet, Jacques Pinaton:
A survey of semantic web standards to representing knowledge in problem solving situations. CAMP 2012: 121-125 - [c8]Pamela Viale, Norbert Giambiasi, Claudia S. Frydman, Jacques Pinaton:
Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP). SpringSim (TMS-DEVS) 2012: 51 - [c7]Gloria Rodríguez-Verján, Stéphane Dauzère-Pérès
A mathematical model for estimating defect inspection capacity with a dynamic control strategy. WSC 2012: 186:1-186:9 - 2011
- [c6]Pamela Viale, Claudia S. Frydman, Jacques Pinaton:
New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge. AICCSA 2011: 84-89 - [c5]Pamela Viale, Claudia S. Frydman, Jacques Pinaton:
Constructing DEVS models based on experts' knowledge: application to STMicroelectronics' large scale manufacturing processes. SpringSim (TMS-DEVS) 2011: 193-198 - [c4]Claude Yugma, Stéphane Dauzère-Pérès
A smart sampling scheduling and skipping simulator and its evaluation on real data sets. WSC 2011: 1908-1917 - [c3]Gloria Rodríguez-Verján, Stéphane Dauzère-Pérès
Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing. WSC 2011: 1918-1925 - 2010
- [c2]Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton:
Modeling Large Scale Manufacturing Process from Timed Data - Using the TOM4L Approach and Sequence Alignment Information for Modeling STMicroelectronics' Production Processes. ICEIS (2) 2010: 129-138 - [c1]Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton:
Discovering Large Scale Manufacturing Process Models from Timed Data - Application to STMicroelectronics' Production Processes. ICSOFT (1) 2010: 227-235
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-07 21:21 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: