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"Oscillation-Based Test Applied to a Wideband CCII."

Pablo A. Petrashin et al. (2017)

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DOI: 10.1155/2017/5075103

access: open

type: Journal Article

metadata version: 2019-06-02

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  dblp key:
  - journals/vlsi/PetrashinTLOS17
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  - https://dblp.org/rec/journals/vlsi/PetrashinTLOS17
Pablo A. Petrashin, Luis E. Toledo, Walter J. Lancioni, Piotr J. Osuch, Tinus Stander:
Oscillation-Based Test Applied to a Wideband CCII. VLSI Design 2017: 5075103:1-5075103:6 (2017)

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