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"Delay testing of partially depleted silicon-on-insulator (PD-SOI) circuits."

Eric W. MacDonald, Nur A. Touba (2006)

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DOI: 10.1109/TVLSI.2006.878209

access: closed

type: Journal Article

metadata version: 2023-03-10

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  - https://dblp.org/rec/journals/tvlsi/MacDonaldT06
Eric W. MacDonald, Nur A. Touba:
Delay testing of partially depleted silicon-on-insulator (PD-SOI) circuits. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 587-595 (2006)

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