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"Investigation of the occurrence of: no-faults-found in electronic equipment."

Jeff Jones, Joe Hayes (2001)

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DOI: 10.1109/24.974126

access: closed

type: Journal Article

metadata version: 2020-07-09

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Jeff Jones, Joe Hayes:
Investigation of the occurrence of: no-faults-found in electronic equipment. IEEE Trans. Reliab. 50(3): 289-292 (2001)

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