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"Accelerated life tests for products of unequal size."

Do Sun Bai, Hyung Je Yun (1996)

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DOI: 10.1109/24.556583

access: closed

type: Journal Article

metadata version: 2020-08-20

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  - journals/tr/BaiY96
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  - https://dblp.org/rec/journals/tr/BaiY96
Do Sun Bai, Hyung Je Yun:
Accelerated life tests for products of unequal size. IEEE Trans. Reliab. 45(4): 611-618 (1996)

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