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"An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS ..."

Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya (2008)

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DOI: 10.1109/TIM.2008.926414

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/RahamanDB08
Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell. IEEE Trans. Instrum. Meas. 57(12): 2838-2845 (2008)

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