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"Gate Characterization Using Singular Value Decomposition: Foundations and ..."

Sheng Wei et al. (2012)

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DOI: 10.1109/TIFS.2011.2181500

access: closed

type: Journal Article

metadata version: 2023-07-04

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  - https://dblp.org/rec/journals/tifs/WeiNNKP12
Sheng Wei, Ani Nahapetian, Michael Nelson, Farinaz Koushanfar, Miodrag Potkonjak:
Gate Characterization Using Singular Value Decomposition: Foundations and Applications. IEEE Trans. Inf. Forensics Secur. 7(2): 765-773 (2012)

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