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"Short-Time Adaline Based Fault Feature Extraction for Inter-Turn Short ..."

Dong Wei et al. (2023)

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DOI: 10.1109/TIE.2022.3167164

access: closed

type: Journal Article

metadata version: 2024-02-28

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  - https://dblp.org/rec/journals/tie/WeiLHPCD23
Dong Wei, Kan Liu, Wei Hu, Xiaoyan Peng, Yongdan Chen, Rongjun Ding:
Short-Time Adaline Based Fault Feature Extraction for Inter-Turn Short Circuit Diagnosis of PMSM via Residual Insulation Monitoring. IEEE Trans. Ind. Electron. 70(3): 3103-3114 (2023)

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