default search action

combined dblp search
author search
venue search
publication search

ask others

"A New Complete Condition Monitoring Method for SiC Power MOSFETs."

Enes Ugur et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TIE.2020.2970668

access: closed

type: Journal Article

metadata version: 2020-12-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/UgurXYPA21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/UgurXYPA21
Enes Ugur, Chi Xu, Fei Yang, Shi Pu, Bilal Akin:
A New Complete Condition Monitoring Method for SiC Power MOSFETs. IEEE Trans. Ind. Electron. 68(2): 1654-1664 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.