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"Extreme (X-)Testing With Binary Data and Applications to Reliability ..."

David Mease, Vijayan N. Nair (2006)

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DOI: 10.1198/004017006000000138

access: closed

type: Journal Article

metadata version: 2017-05-27

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David Mease, Vijayan N. Nair:
Extreme (X-)Testing With Binary Data and Applications to Reliability Demonstration. Technometrics 48(3): 399-410 (2006)

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