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"Read Disturbance Reduction Technique for Offset-Canceling Dual-Stage ..."

Taehui Na et al. (2016)

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DOI: 10.1109/TCSII.2016.2530883

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - https://dblp.org/rec/journals/tcas/NaKKJ16
Taehui Na, Jung Pill Kim, Seung-Hyuk Kang, Seong-Ook Jung:
Read Disturbance Reduction Technique for Offset-Canceling Dual-Stage Sensing Circuits in Deep Submicrometer STT-RAM. IEEE Trans. Circuits Syst. II Express Briefs 63-II(6): 578-582 (2016)

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