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"A universal MOSFET mobility degradation model for circuit simulation."

Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee (1990)

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DOI: 10.1109/43.62736

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/YericTB90
Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee:
A universal MOSFET mobility degradation model for circuit simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(10): 1123-1126 (1990)

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