default search action

combined dblp search
author search
venue search
publication search

ask others

"Secure Scan and Test Using Obfuscation Throughout Supply Chain."

Xiaoxiao Wang et al. (2018)

> Home

Details and statistics

DOI: 10.1109/TCAD.2017.2772817

access: closed

type: Journal Article

metadata version: 2022-09-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/WangZHST18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/WangZHST18
Xiaoxiao Wang, Dongrong Zhang, Miao Tony He, Donglin Su, Mark M. Tehranipoor:
Secure Scan and Test Using Obfuscation Throughout Supply Chain. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(9): 1867-1880 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.