default search action

combined dblp search
author search
venue search
publication search

ask others

"Interconnect Testing and Test-Path Scheduling for Interposer-Based 2.5-D ICs."

Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik (2015)

> Home

Details and statistics

DOI: 10.1109/TCAD.2014.2365097

access: closed

type: Journal Article

metadata version: 2022-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/WangCB15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/WangCB15
Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik:
Interconnect Testing and Test-Path Scheduling for Interposer-Based 2.5-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(1): 136-149 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.