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"Test application time reduction for sequential circuits with scan."

Soo Young Lee, Kewal K. Saluja (1995)

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DOI: 10.1109/43.406714

access: closed

type: Journal Article

metadata version: 2020-09-24

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Soo Young Lee, Kewal K. Saluja:
Test application time reduction for sequential circuits with scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(9): 1128-1140 (1995)

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