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"A Simulator for At-Speed Robust Testing of Path Delay Faults in ..."

Yuan-Chieh Hsu, Sandeep K. Gupta (1996)

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DOI: 10.1109/12.544489

access: closed

type: Journal Article

metadata version: 2023-09-22

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  dblp key:
  - journals/tc/HsuG96
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  persistent URL:
  - https://dblp.org/rec/journals/tc/HsuG96
Yuan-Chieh Hsu, Sandeep K. Gupta:
A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits. IEEE Trans. Computers 45(11): 1312-1318 (1996)

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