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"Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing."

Zeev Barzilai, Don Coppersmith, Arnold L. Rosenberg (1983)

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DOI: 10.1109/TC.1983.1676202

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/tc/BarzilaiCR83
Zeev Barzilai, Don Coppersmith, Arnold L. Rosenberg:
Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing. IEEE Trans. Computers 32(2): 190-194 (1983)

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