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"BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design ..."

Chih-Ang Chen, Sandeep K. Gupta (1996)

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DOI: 10.1109/12.485565

access: closed

type: Journal Article

metadata version: 2023-09-26

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  dblp key:
  - journals/tc/ChenG96
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  persistent URL:
  - https://dblp.org/rec/journals/tc/ChenG96
Chih-Ang Chen, Sandeep K. Gupta:
BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design Algorithms. IEEE Trans. Computers 45(3): 257-269 (1996)

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