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"Noise characterization in scanning tunneling microscopy (STM)."

Miguel Aguilar, Manuel Pancorbo (1994)

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DOI: 10.1016/0167-8655(94)90030-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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Miguel Aguilar, Manuel Pancorbo:
Noise characterization in scanning tunneling microscopy (STM). Pattern Recognit. Lett. 15(10): 985-992 (1994)

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