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"High-yield assembly of multichip modules through known-good IC's and ..."

John K. Hagge, Russell J. Wagner (1992)

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DOI: 10.1109/5.192076

access: closed

type: Journal Article

metadata version: 2022-06-16

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  - https://dblp.org/rec/journals/pieee/HaggeW92
John K. Hagge, Russell J. Wagner:
High-yield assembly of multichip modules through known-good IC's and effective test strategies. Proc. IEEE 80(12): 1965-1994 (1992)

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