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"Early estimation of defect density using an in-process Haskell metrics model."

Mark Sherriff et al. (2005)

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DOI: 10.1145/1082983.1083285

access: closed

type: Journal Article

metadata version: 2020-09-17

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  - journals/sigsoft/SherriffNWV05
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  - https://dblp.org/rec/journals/sigsoft/SherriffNWV05
Mark Sherriff, Nachiappan Nagappan, Laurie A. Williams, Mladen A. Vouk:
Early estimation of defect density using an in-process Haskell metrics model. ACM SIGSOFT Softw. Eng. Notes 30(4): 1-6 (2005)

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