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"Electronic explosives inspection: a fine-grained X-ray benchmark and ..."

Jianzhao Cui et al. (2024)

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DOI: 10.1007/S11042-023-17388-1

access: closed

type: Journal Article

metadata version: 2024-08-28

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  - https://dblp.org/rec/journals/mta/CuiLZHF24
Jianzhao Cui, Xiongfei Li, Xiaoli Zhang, Sa Huang, Yuncong Feng:
Electronic explosives inspection: a fine-grained X-ray benchmark and few-shot prohibited phone detection model. Multim. Tools Appl. 83(16): 47919-47941 (2024)

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